CUSUM Control Chart for Symlets Wavelet to Monitor Production Process Quality.
Abstract
In this paper, it was proposed to create a new chart that represents the Symlets wavelet chart with orders of (1, 2, and 3) to obtain discrete wavelet transformation maximum overall coefficients, through which the threshold parameter is estimated using the universal method and then applied hard threshold rule to obtain de-noise data which will be relied upon in constructing the Cumulative Sum Chart using the Tabular method. The efficiency of the proposed chart was measured and compared to the classical chart by simulating several cases and real data and calculating the difference between the control limits (Difference), the standard deviation and the number of points outside the control limits to determine the sensitivity of the chart to minor changes that may occur in the production process, using an algorithm in the MATLAB program it was designed for this purpose. The research results revealed that the proposed charts are more efficient and sensitive to minor changes (that may event) in the production process than the classical charts.
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